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Volumn 36, Issue 5, 1997, Pages 372-377
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Application of the small-angle cleavage technique to thickness measurement of TEM samples
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Author keywords
cleavage planes; cleaving; TEM specimen preparation; transmission electron microscopy
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Indexed keywords
GALLIUM ARSENIDE;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
III-V SEMICONDUCTORS;
IMAGE SEGMENTATION;
SEMICONDUCTOR QUANTUM WELLS;
SINGLE CRYSTALS;
SPECIMEN PREPARATION;
CLEAVAGE PLANE;
CLEAVING;
DYNAMICAL THEORY;
MEASUREMENTS OF;
MODEL TRANSMISSION;
REGION-OF-INTEREST;
REGIONS OF INTEREST;
SAMPLE THICKNESS;
TRANSMISSION ELECTRON MICROSCOPY IMAGES;
TRANSMISSION ELECTRON MICROSCOPY SPECIMEN PREPARATION;
THICKNESS MEASUREMENT;
CONFERENCE PAPER;
LABORATORY TEST;
PRIORITY JOURNAL;
SAMPLE;
THICKNESS;
TISSUE SECTION;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 0030898543
PISSN: 1059910X
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1097-0029(19970301)36:5<372::AID-JEMT5>3.0.CO;2-N Document Type: Conference Paper |
Times cited : (6)
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References (9)
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