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Volumn 165, Issue 1-3, 1997, Pages 312-315
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Influence of the thickness of the CoFe layer on the negative spin-valve effect in CoFe/Ag/CoFeGd trilayers
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Author keywords
Atomic force microscopy; Interface roughness; Spin valve effect; Thin films trilayer
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Indexed keywords
AMORPHOUS FILMS;
ATOMIC FORCE MICROSCOPY;
COBALT ALLOYS;
ELECTRON SCATTERING;
INTERFACES (MATERIALS);
MAGNETIC ANISOTROPY;
MAGNETIC THIN FILMS;
MAGNETORESISTANCE;
SILVER;
SURFACE ROUGHNESS;
SPIN VALVE EFFECT;
METALLIC SUPERLATTICES;
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EID: 0030871496
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-8853(96)00539-2 Document Type: Article |
Times cited : (9)
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References (9)
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