Wavelength dependences of the dielectric constant of thermally evaporated aluminum films

Surface Science

Volumn 371, Issue 1, 1997, Pages 149-156

  Shinya, A ^a   Okuno, Y ^a   Fukui, M ^a   Shintani, Y ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

Aluminum; Grain boundaries; Metallic films; Metallic surfaces; Oxidation; Polaritons; Reflection spectroscopy

Indexed keywords

ALUMINUM; ELECTRONS; EVAPORATION; GRAIN BOUNDARIES; OXIDATION; PERMITTIVITY; SPECTROSCOPY; SURFACES;

POLARITONS; THERMALLY EVAPORATED ALUMINUM FILMS;

METALLIC FILMS;

EID: 0030867022     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)00972-7     Document Type: Article

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