Novel hierarchical test generation method for processors

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1997, Pages 540-541

  Tupuri, R S ^a   Abraham, J A ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL; DESIGN; TESTING; VLSI CIRCUITS;

HIERARCHICAL TEST GENERATION;

PROGRAM PROCESSORS;

EID: 0030857738     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)