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Volumn 40, Issue 1, 1997, Pages 58-64
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Analyses of delamination arrest effect of dimples on interface in LSI package
a a a a a |
Author keywords
Boundary Element Method; Contact Problem; Delamination; Dimple; Interface Crack; LSI Package; Stress Intensity Factor; Structural Analysis; Thermal Stress
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Indexed keywords
BOUNDARY ELEMENT METHOD;
CALCULATIONS;
CRACKS;
ELECTRONICS PACKAGING;
INTERFACES (MATERIALS);
LSI CIRCUITS;
PLASTICS APPLICATIONS;
PRESSURE EFFECTS;
STRESS INTENSITY FACTORS;
THERMAL STRESS;
DIMPLE;
STEAM PRESSURE LOAD;
THERMAL PRESSURE LOAD;
DELAMINATION;
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EID: 0030855586
PISSN: 13408046
EISSN: None
Source Type: Journal
DOI: 10.1299/jsmea1993.40.1_58 Document Type: Article |
Times cited : (2)
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References (6)
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