Optical properties of the epitaxial Pb1-xLaxTiO3 thin films grown by metalorganic chemical vapor deposition

Applied Physics Letters

Volumn 70, Issue 2, 1997, Pages 143-145

  Kim, Y ^a,b   Erbil, A ^b  

^a SAMSUNG Electronics   (South Korea)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CALCULATIONS; CRYSTAL ORIENTATION; LEAD COMPOUNDS; LIGHT TRANSMISSION; MAGNESIA; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL VARIABLES MEASUREMENT; PRISMS; REFRACTIVE INDEX; SPECTROPHOTOMETRY;

LEAD LANTHANUM TITANATE; PRISM COUPLING METHOD; SELLMEIER DISPERSION FORMULA;

THIN FILMS;

EID: 0030855567     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118340     Document Type: Article

References (8)

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