Design for testability and built-in self-test of mixed-signal circuits: a tutorial

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1997, Pages 388-392

  Chatterjee, A ^a   Nagi, N ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG COMPUTERS; DIGITAL COMPUTERS; TELECOMMUNICATION SYSTEMS; TESTING;

BUILD-IN SELF-TEST; MIXED-SIGNAL CIRCUITS;

VLSI CIRCUITS;

EID: 0030838138     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (43)