Surface characterization of thin layers of aluminium oxide

Surface and Coatings Technology

Volumn 88, Issue 1-3, 1997, Pages 103-111

  Raveh, A ^a,b   Tsameret, Z K ^a   Grossman, E ^c  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b Division of Chemistry   (Israel)

^c Ultrasonic Section   (Israel)

Author keywords

Aluminium oxide; Surface characterization; Thin films

Indexed keywords

ALUMINA; ALUMINUM ALLOYS; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; OXIDATION; OXIDES; SURFACE STRUCTURE;

MICROHARDNESS; OXIDE THIN FILMS; SURFACE TOPOGRAPHY;

THIN FILMS;

EID: 0030838129     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(95)02757-2     Document Type: Article

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