Texture development in SiC-seeded AIN

Acta Materialia

Volumn 45, Issue 1, 1997, Pages 383-396

  Sandlin, M S ^a,b   Bowman, K J ^a   Root, J ^c  

^a PURDUE UNIVERSITY   (United States)

^b Lockheed Martin Specialty Components   (United States)

^c CANADIAN NUCLEAR LABORATORIES   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; ANNEALING; MICROSCOPIC EXAMINATION; NITRIDES; POLYCRYSTALLINE MATERIALS; SILICON CARBIDE; TEXTURES; X RAY DIFFRACTION ANALYSIS;

CARBIDE SEED PARTICLES; POLYCRYSTALLINE ALUMINUM NITRIDE; QUANTITATIVE TEXTURE MEASUREMENTS;

CERAMIC MATERIALS;

EID: 0030837850     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(96)00148-6     Document Type: Article

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