FAMAS: FAult Modeling via Adaptive Simulation

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1997, Pages 413-417

  Jin, H ^a   Iyer, R K ^a   Hsueh, M C ^a   Covington, M ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ERRORS; MATHEMATICAL MODELS; MATHEMATICAL TECHNIQUES; PROBABILITY; TRANSIENTS;

FAULT MODELING;

DIGITAL CIRCUITS;

EID: 0030837304     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)