Thermal and optical characterization of high purity α-octithiophene

Advanced Materials

Volumn 9, Issue 1, 1997, Pages 75-80

  Fichou, Denis ^a   Teulade Fichou, Marie Paule ^b   Horowitz, Gilles ^a   Demanze, Frédéric ^a  

^a CNRS   (France)

^b PSL Research University   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL SCANNING CALORIMETRY; MASS SPECTROMETRY; MOLECULES; PYROLYSIS; SUBLIMATION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

MASS SPECTROSCOPY; MICROCRYSTALLINE POWDER; THIOPHENE OLIGOMERS; X RAY STRUCTURE;

OLIGOMERS;

EID: 0030836833     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.19970090118     Document Type: Article

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34. 2 (1) The refractive index of an isotropic α-8T thin film has been measured by an attenuated total reflection technique at λ = 632.8 nm, i.e., in the transparency region, and found to be as high as n = 2.07 (for comparison, the refractive index of an isotropic α-6T film is 1.96) [13]. In the case of the α-8T crystal, this n value is only indicative since the refractive index is expected to be strongly anisotropic.