Performance degradation analysis using principal component method

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 1997, Pages 136-141

  Yang, Kai ^a   Yang, Guangbin ^a  

^a WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; DEGRADATION; EIGENVALUES AND EIGENFUNCTIONS; LIGHT EMITTING DIODES; MATRIX ALGEBRA; NUMERICAL METHODS; PERFORMANCE; PRODUCT DESIGN;

PERFORMANCE DEGRADATION ANALYSIS; PRINCIPAL COMPONENT METHOD;

RELIABILITY THEORY;

EID: 0030834755     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)