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Volumn 28, Issue 1, 1997, Pages 1-12

The Trench Insulated Gate Bipolar Transistor - A high power switching device

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT LAYOUT; MOSFET DEVICES; SWITCHING CIRCUITS;

EID: 0030833112     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2692(96)00058-4     Document Type: Article
Times cited : (2)

References (13)
  • 1
    • 0022914469 scopus 로고
    • A new injection suppression structure for conductivity modulated power MOSFETs
    • D. Ueda et al., A new injection suppression structure for conductivity modulated power MOSFETs, in Proc. 18th Int. Conf. on Solid State Device and Materials, Vol. 31, pp. 97, 1986.
    • (1986) Proc. 18th Int. Conf. on Solid State Device and Materials , vol.31 , pp. 97
    • Ueda, D.1
  • 2
    • 0024739104 scopus 로고
    • 500-V n-channel Insulated-Gate Bipolar Transistor with a trench gate structure
    • H.-R. Chang and B.J. Baliga, 500-V n-channel Insulated-Gate Bipolar Transistor with a trench gate structure, IEEE Trans. Electron Device, ED-36 (1989) 1824.
    • (1989) IEEE Trans. Electron Device , vol.ED-36 , pp. 1824
    • Chang, H.-R.1    Baliga, B.J.2
  • 5
    • 0028398882 scopus 로고
    • The effect of the hole current on the channel inversion in Trench Insulated Gate Bipolar Transistors
    • F. Udrea, G.A.J. Amaratunga and Q. Huang, The effect of the hole current on the channel inversion in Trench Insulated Gate Bipolar Transistors, Solid State Electronics, 37 (1994) 507.
    • (1994) Solid State Electronics , vol.37 , pp. 507
    • Udrea, F.1    Amaratunga, G.A.J.2    Huang, Q.3
  • 6
    • 0029345913 scopus 로고
    • Theoretical comparison between trench and DMOS technologies for Insulated Gate Bipolar Transistors
    • F. Udrea and G.A.J. Amaratunga, Theoretical comparison between trench and DMOS technologies for Insulated Gate Bipolar Transistors, IEEE Trans. Electron Device, 42 (1995) 1356.
    • (1995) IEEE Trans. Electron Device , vol.42 , pp. 1356
    • Udrea, F.1    Amaratunga, G.A.J.2
  • 8
    • 0027891679 scopus 로고
    • A 4500 V Injection Enhanced Insulated Gate Bipolar Transistor (IEGT) operating in a mode similar to a thyristor
    • M. Kitagawa, I. Omura, S. Hasegawa, T. Inoue and A. Nakagawa, A 4500 V Injection Enhanced Insulated Gate Bipolar Transistor (IEGT) operating in a mode similar to a thyristor, IEDM Tech. Dig. (1993) 679.
    • (1993) IEDM Tech. Dig. , pp. 679
    • Kitagawa, M.1    Omura, I.2    Hasegawa, S.3    Inoue, T.4    Nakagawa, A.5
  • 10
    • 0009599273 scopus 로고
    • Characterisation of electron mobility in the inverted <100> Si surfaces
    • A. Sabnis and J.T. Clemens, Characterisation of electron mobility in the inverted <100> Si surfaces, IEDM Tech. Dig. (1979) 18.
    • (1979) IEDM Tech. Dig. , pp. 18
    • Sabnis, A.1    Clemens, J.T.2
  • 12
    • 0027698295 scopus 로고
    • Mobility study on RIE etched silicon surfaces using SF6/O2 gas etchants
    • T. Syau and B.J. Baliga, Mobility study on RIE etched silicon surfaces using SF6/O2 gas etchants, IEEE Trans. Electron Device, ED-40 (1993) 1997.
    • (1993) IEEE Trans. Electron Device , vol.ED-40 , pp. 1997
    • Syau, T.1    Baliga, B.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.