Identification of grain boundary effects in current-voltage curves of polycrystalline high-Tc superconductors

Physica C: Superconductivity and its Applications

Volumn 273, Issue 3-4, 1997, Pages 275-280

  Hettinger, J D ^a   Gray, K E ^a   Miller, D J ^a   Kim, D H ^a   Steel, D G ^a   Washburn, B R ^a   Sharping, J ^a   Moreau, C ^a   Eddy, M ^b   Tkaczyk, J E ^c   DeLuca, J ^c   Kang, J H ^d   Talvacchio, J ^d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b SUPERCONDUCTOR TECHNOLOGIES INC   (United States)

^c GE GLOBAL RESEARCH   (United States)

^d WESTINGHOUSE ELECTRIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC LOSSES; GRAIN BOUNDARIES; ION BOMBARDMENT; POLYCRYSTALS; SUPERCONDUCTIVITY;

CURRENT VOLTAGE CURVES; GRAIN BOUNDARY EFFECTS; INTERGRANULAR WEAK LINK; INTRAGRANULAR FLUX CREEP; ION IRRADIATION; STRONGLY COUPLED CURRENT PATHS;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0030833035     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(96)00648-X     Document Type: Article

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