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Volumn 82, Issue 5-6, 1997, Pages 630-634
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Trace-element fractionation by impact-induced volatilization: SIMS study of lunar HASP samples
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
FRACTIONATION;
IMPACT;
LUNAR REGOLITH;
SIMS;
TRACE ELEMENT;
VOLATILIZATION;
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EID: 0030831523
PISSN: 0003004X
EISSN: None
Source Type: Journal
DOI: 10.2138/am-1997-5-622 Document Type: Article |
Times cited : (18)
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References (0)
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