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Volumn 30, Issue 2, 1997, Pages 194-201
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Properties of hydrogenated amorphous silicon carbide films prepared by a separately excited plasma CVD method
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION SPECTROSCOPY;
CHEMICAL VAPOR DEPOSITION;
ENERGY GAP;
HYDROGENATION;
INFRARED SPECTROSCOPY;
PHOTOCONDUCTIVITY;
PHOTOSENSITIVITY;
PLASMA APPLICATIONS;
SILICON CARBIDE;
ULTRAVIOLET SPECTROSCOPY;
X RAY PHOTOELECTRON SPECTROSCOPY;
SEPARATELY EXCITED PLASMA CHEMICAL VAPOR DEPOSITION (SEPCVD) SYSTEM;
SILICON CARBIDE FILMS;
AMORPHOUS FILMS;
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EID: 0030821076
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/30/2/006 Document Type: Article |
Times cited : (20)
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References (15)
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