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Volumn 32, Issue 8, 1997, Pages 795-806

Fundamentals of focal plane detectors

Author keywords

Focal plane detectors; Magnetic sector mass spectrometry

Indexed keywords

ACCURACY; ION CURRENT; MASS SPECTROMETER; MASS SPECTROMETRY; OPTICAL RESOLUTION; PRIORITY JOURNAL; PRODUCTIVITY; REVIEW;

EID: 0030798882     PISSN: 10765174     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9888(199708)32:8<795::AID-JMS540>3.0.CO;2-U     Document Type: Review
Times cited : (21)

References (26)
  • 2
    • 0004082526 scopus 로고
    • Keithley Instruments, Cleveland, OH
    • Low Level Measurements, 4th ed. Keithley Instruments, Cleveland, OH (1992).
    • (1992) Low Level Measurements, 4th Ed.
  • 3
    • 15644382517 scopus 로고    scopus 로고
    • Int. Pat. WO91/00612 (1989)
    • K. Birkinshaw, Int. Pat. WO91/00612 (1989).
    • Birkinshaw, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.