Two distinct models account for short and long deletions within sequence repeats in Escherichia coli

Journal of Bacteriology

Volumn 179, Issue 20, 1997, Pages 6512-6517

  Schumacher, S ^a   Fuchs, R P P ^a   Bichara, M ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

PLASMID DNA;

ARTICLE; BASE MISPAIRING; CONTROLLED STUDY; DELETION MUTANT; DNA REPAIR; ESCHERICHIA COLI; GENE SEQUENCE; NONHUMAN; PRIORITY JOURNAL;

EID: 0030791788     PISSN: 00219193     EISSN: None     Source Type: Journal    
DOI: 10.1128/jb.179.20.6512-6517.1997     Document Type: Article

References (26)