Improved signal-to-noise ratio in glow discharge ion trap mass spectrometry via pulsed discharge operation

Journal of Analytical Atomic Spectrometry

Volumn 12, Issue 1, 1997, Pages 43-48

  Duckworth, Douglas C ^a   Smith, David H ^a   Mcluckey, Scott A ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Direct solids analysis; Elemental analysis; Gated ion injection; Glow discharge ion trap mass spectrometry; Noise; Pulsed discharge

Indexed keywords

BRASS; DATA ACQUISITION; ELECTRONS; GLOW DISCHARGES; ION SOURCES; SIGNAL TO NOISE RATIO; TRACE ANALYSIS; TRACE ELEMENTS;

DIRECT SOLIDS ANALYSIS; ELEMENTAL ANALYSIS; GATED ION INJECTION; GLOW DISCHARGE ION TRAP MASS SPECTROMETRY;

MASS SPECTROMETRY;

EID: 0030788792     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a605312b     Document Type: Article

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