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Volumn 45, Issue 1, 1997, Pages 46-51

A table-based bias and temperature-dependent small-signal and noise equivalent circuit model

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; DATA STORAGE EQUIPMENT; ELECTRIC VARIABLES MEASUREMENT; EQUIVALENT CIRCUITS; INTERPOLATION; MICROWAVE AMPLIFIERS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; OPTIMIZATION; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS;

EID: 0030787659     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.552031     Document Type: Article
Times cited : (10)

References (17)
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  • 3
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    • Resolving capacitor discrepancies between large and small signal FET models
    • M. Calvo, A. Snider and L. Dunleavy, Resolving capacitor discrepancies between large and small signal FET models in IEEE MTT-S 1995 Int. Microwave Symp., pp. 1251-1254.
    • IEEE MTT-S , vol.1995 , pp. 1251-1254
    • Calvo, M.1    Snider, A.2    Dunleavy, L.3
  • 4
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    • 12 GHz Low-noise MMIC amplifier designed with a noise model that scales with MODFET size and bias
    • Dec.
    • B. Hughes, J. Perdomo, and H. Kondoh, 12 GHz Low-noise MMIC amplifier designed with a noise model that scales with MODFET size and bias IEEE Trans. Microwave Theory Tech., vol. 41, pp. 2311-2316, Dec. 1993.
    • (1993) IEEE Trans. Microwave Theory Tech. , vol.41 , pp. 2311-2316
    • Hughes, B.1    Perdomo, J.2    Kondoh, H.3
  • 5
    • 0029221711 scopus 로고    scopus 로고
    • A table based bias and temperature dependent small-signal and noise equivalent circuit model
    • P. B. Winson, S. M. Lardizabal, and L. Dunleavy, A table based bias and temperature dependent small-signal and noise equivalent circuit model in IEEE MTT-S 1995 Int. Microwave Symp., pp. 623-626.
    • IEEE MTT-S 1995 Int. Microwave Symp. , pp. 623-626
    • Winson, P.B.1    Lardizabal, S.M.2    Dunleavy, L.3
  • 6
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    • A novel algorithm for bias-dependent CASCODE FET modeling,IEEE MTT-S 1995 Int
    • P. B. Winson et al., A novel algorithm for bias-dependent CASCODE FET modeling in IEEE MTT-S 1995 Int. Microwave Symp., pp. 627-630.
    • Microwave Symp., Pp. 627-630.
    • Winson, P.B.1
  • 7
    • 0028060930 scopus 로고
    • Experimental investigation of the temperature dependence of pHEMT noise parameters
    • S. M. Lardizabal and L. Dunleavy, Experimental investigation of the temperature dependence of pHEMT noise parameters in IEEE MTT-S Dig., 1994.
    • (1994) IEEE MTT-S Dig.
    • Lardizabal, S.M.1    Dunleavy, L.2
  • 8
    • 35848958750 scopus 로고    scopus 로고
    • Gateway Modeling, Inc., Minneapolis, MN 55414.
    • SPECIAL, Gateway Modeling, Inc., Minneapolis, MN 55414.
    • SPECIAL
  • 9
    • 0027540380 scopus 로고
    • Extraction of Device noise sources from measured data using circuit simulator software
    • Feb.
    • P. Ikalainen, Extraction of Device noise sources from measured data using circuit simulator software IEEE Trans. Microwave Theory Tech., vol. 41, pp. 340-343, Feb. 1993.
    • (1993) IEEE Trans. Microwave Theory Tech. , vol.41 , pp. 340-343
    • Ikalainen, P.1
  • 12
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    • Improved FET noise model extraction method for statistical model development,IEEE Microwave Theory and Techniques Symp
    • S. Prichett et al., Improved FET noise model extraction method for statistical model development in IEEE Microwave Theory and Techniques Symp. Dig., 1995, pp. 943-946.
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    • Experimental investigation of the temperature dependence of GaAs FET equivalent circuits
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    • R. Anholt and S. Swirhun, Experimental investigation of the temperature dependence of GaAs FET equivalent circuits IEEE Trans. Electron Devices, vol. 39, pp. 2029-2035, Sept. 1992.
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    • Anholt, R.1    Swirhun, S.2
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.