High-resolution transmission electron microscopy study of luminescent anodized amorphous silicon

Philosophical Magazine Letters

Volumn 75, Issue 1, 1997, Pages 35-42

  Bustarret, E ^a   Sauvain, E ^a   Ligeon, M ^b  

^a CNRS   (France)

^b UNIV GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; CHEMICAL VAPOR DEPOSITION; PHOTOLUMINESCENCE; POROUS SILICON; RAMAN SCATTERING; SILICON WAFERS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ANODIZED SILICON; HYDROGENATED SILICON; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;

AMORPHOUS SILICON;

EID: 0030787247     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008397179895     Document Type: Article

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