The characterization of strain, impurity content, and crush strength of synthetic diamond crystals

Journal of Materials Research

Volumn 12, Issue 1, 1997, Pages 253-263

  McCormick, Terri L ^a   Jackson, W E ^b   Nemanich, R J ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b GENERAL ELECTRIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; COMPRESSIVE STRENGTH; CRYSTAL DEFECTS; HIGH PRESSURE EFFECTS; HIGH TEMPERATURE EFFECTS; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; STRAIN;

CRUSH FORCE; SYNTHETIC DIAMOND CRYSTAL; ZERO PHONON LINE;

SYNTHETIC DIAMONDS;

EID: 0030787235     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1997.0033     Document Type: Article

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