Characterization of textured polycrystalline diamond by electron spin resonance spectroscopy

Journal of Applied Physics

Volumn 81, Issue 1, 1997, Pages 234-237

  Graeff, C F O ^a,c   Nebel, C E ^a   Stutzmann, M ^a   Floter A ^b   Zachai, R ^b  

^a WALTER SCHOTTKY INSTITUT   (Germany)

^b DAIMLER AG   (Germany)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CHEMICAL VAPOR DEPOSITION; COMPUTER SIMULATION; CRYSTAL GROWTH; CRYSTAL ORIENTATION; ELECTRON SPIN RESONANCE SPECTROSCOPY; MATHEMATICAL MODELS; PARAMAGNETIC RESONANCE; POLYCRYSTALLINE MATERIALS; TEXTURES; X RAY DIFFRACTION;

CENTRAL LINE; CRYSTALLITES; HYPERFINE SATELLITE LINES; POLYCRYSTALLINE DIAMOND;

DIAMOND FILMS;

EID: 0030787205     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363987     Document Type: Article

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