The use of O1s charge referencing for the X-ray photoelectron spectroscopy of Al/Si, Al/Ti and Al/Zr mixed oxides

Journal of Materials Science Letters

Volumn 16, Issue 1, 1997, Pages 1-3

  Bhattacharya, A K ^a   Pyke, D R ^a   Reynolds, R ^a   Walker, G S ^a   Werrett, C R ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; BINDING ENERGY; ELECTRON ENERGY LEVELS; SILICA; THIN FILMS; TITANIUM DIOXIDE; ZIRCONIA;

CHARGE REFERENCING; PHOTOELECTRON ENERGY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030785245     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018521126248     Document Type: Article

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