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Volumn 165, Issue 1-3, 1997, Pages 280-283
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Characterization of electrodeposited Co/Cu ultrathin films and multilayers
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Author keywords
Electrodeposition; Giant magnetoresistance; Multilayer; Reflection electron microscopy; Thin films
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Indexed keywords
ANTIFERROMAGNETISM;
COBALT ALLOYS;
COPPER ALLOYS;
ELECTRODEPOSITION;
ELECTRON MICROSCOPY;
FERROMAGNETISM;
MAGNETORESISTANCE;
METALLIC SUPERLATTICES;
MONOLAYERS;
PLATINUM;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
ULTRATHIN FILMS;
GIANT MAGNETORESISTANCE;
OSCILLATORY ANTIFERROMAGNETIC INTERLAYER COUPLING;
MAGNETIC THIN FILMS;
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EID: 0030784346
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-8853(96)00529-X Document Type: Article |
Times cited : (16)
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References (13)
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