A comparative analysis of surface structure and surface tension of hybrid silica films

Journal of Non-Crystalline Solids

Volumn 209, Issue 1-2, 1997, Pages 51-60

  Della Volpe, C ^a   Dire S ^a   Pagani, E ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MATHEMATICAL MODELS; SILANES; SILICA; SURFACE STRUCTURE; SURFACE TENSION;

ATTENUATED TOTAL REFLECTANCE; HYBRID SILICA FILMS; THEORETICAL MODELS; UNSUPPORTED SILICA FILMS;

THICK FILMS;

EID: 0030783468     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(96)00547-9     Document Type: Article

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