Characterization and implicit identification of sequential indistinguishability

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1997, Pages 376-380

  Boppana, V ^a   Hartanto, I ^a   Fuchs, W K ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; DIGITAL CIRCUITS; TESTING; VLSI CIRCUITS;

SEQUENTIAL INDISTINGUISHABILITY;

INTEGRATED CIRCUITS;

EID: 0030780823     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)