Low-temperature tunnelling-electron luminescence microscopy using tip collection

Journal of Electron Microscopy

Volumn 46, Issue 3, 1997, Pages 199-205

  Murashita, Tooru ^a  

^a NTT CORPORATION   (Japan)

Author keywords

Low temperature tunnelling electron microscopy; Tip collection

Indexed keywords

ELECTRONS; GALLIUM ARSENIDE; GOLD COATINGS; III-V SEMICONDUCTORS; IMAGE RESOLUTION; LASER EXCITATION; LIGHT TRANSMISSION; MICROSCOPES; MULTIMODE FIBERS; OPTICAL PROPERTIES; SEMICONDUCTOR QUANTUM WELLS; TEMPERATURE; TRANSPARENT ELECTRODES;

COLLECTION METHODS; LOW-TEMPERATURE TUNNELING-ELECTRON MICROSCOPY; LOWS-TEMPERATURES; LUMINESCENCE MICROSCOPY; NANOMETRES; REAL-SPACE; SPACE CHARACTERIZATION; SPATIAL RESOLUTION; TIP COLLECTION; TUNNELLING ELECTRON MICROSCOPY;

LUMINESCENCE;

EID: 0030753122     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023509     Document Type: Article

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