Subpixel position measurement using 1D, 2D and 3D centroid algorithms with emphasis on applications in confocal microscopy

Journal of Microscopy

Volumn 186, Issue 3, 1997, Pages 246-257

  Patwardhan, A ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Centroid algorithm; Confocal microscopy; Distance measurement; Microspheres; Perturbations; Photon statistics; Position measurement; Subpixel; Threshold

Indexed keywords

CONFOCAL MICROSCOPY; ERRORS; MICROSPHERES; PHOTONS; POSITION MEASUREMENT;

CENTROID ALGORITHM; NORMAL OPERATING CONDITIONS; OBJECT POSITIONS; PERTURBATION; PHOTON NOISE; PHOTON STATISTICS; SUB-PIXELS; TAKE-ALL; THRESHOLD; TOTAL ERRORS;

PIXELS;

MICROSPHERE;

ALGORITHM; ARTICLE; CALCULATION; CONFOCAL MICROSCOPY; PHOTON; POSITION; PRIORITY JOURNAL;

EID: 0030743058     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1997.1970761.x     Document Type: Article

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