sImpurities and dopants in vanadium doped CdTe

Optical Materials

Volumn 7, Issue 1-2, 1997, Pages 21-31

  Gauneau, M ^a   Volle, R ^a   Martel, G ^a   Moisan, J Y ^a  

^a ORANGE LABS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIVES; CARRIER CONCENTRATION; CRYSTAL IMPURITIES; DIFFRACTION GRATINGS; ELECTRON ENERGY LEVELS; ELECTROOPTICAL EFFECTS; OPTICAL MATERIALS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTOR DOPING; VANADIUM;

CADMIUM TELLURIDE; CONCENTRATIONS OF DEEP LEVELS; FREE CARRIERS; GRATING SPACING; PHYSICO CHEMICAL ANALYSES;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0030736942     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(96)00061-4     Document Type: Article

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