Electrical properties of metal/langmuir-blodgett (polymeraldine base) layer/metal devices

Journal of Applied Polymer Science

Volumn 63, Issue 2, 1997, Pages 141-145

  Ram, M K ^a   Gowri, R ^a   Malhotra, B D ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; FABRICATION; GLASS; LANGMUIR BLODGETT FILMS; METALS; ORGANIC POLYMERS;

CAPACITANCE VOLTAGE MEASUREMENT; CURRENT VOLTAGE MEASUREMENT; INDIUM TIN OXIDE GLASS; INSULATING PROPERTIES; METAL INSULATOR METAL STRUCTURES; POLYANILINE; RECTIFICATION BEHAVIOR; SCHOTTKY BEHAVIOR;

MIM DEVICES;

EID: 0030736689     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4628(19970110)63:2<141::AID-APP1>3.0.CO;2-V     Document Type: Article

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