![]() |
Volumn 68, Issue 1, 1997, Pages 1080-1082
|
Soft x-ray and Auger electron spectroscopy of single and double electron capture processes in Slow Ne8++He collisions
a,e
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CALCULATIONS;
ELECTRON ENERGY LEVELS;
ELECTRON SCATTERING;
HELIUM;
ION BEAMS;
NEON;
PLASMAS;
X RAY SPECTROSCOPY;
AUGER DECAY;
ELECTRON CAPTURE PROCESSES;
GROUND STATE;
PLASMA IMPURITIES;
POTENTIAL ENERGY;
CHARGE TRANSFER;
|
EID: 0030736148
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1147792 Document Type: Article |
Times cited : (11)
|
References (17)
|