Grain boundary analysis in superplastic sio2 - doped TZP

Materials Science Forum

Volumn 233-234, Issue , 1997, Pages 367-372

  Thavorniti, P ^a   Ikuhara, Y ^a   Sakuma, T ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Field Emission TEM; Glass Phase; Grain Boundary; High Resolution Electron Microscopy; Segregation; Superplasticity; TZP

Indexed keywords

DUCTILITY; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; IONS; SILICA; ZIRCONIA;

AMORPHOUS SILICA; GRAIN BOUNDARY ANALYSIS; TETRAGONAL ZIRCONIA POLYCRYSTAL;

SUPERPLASTICITY;

EID: 0030735357     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

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