Reliability estimation for PLC-type optical splitters

Electronics Letters

Volumn 33, Issue 3, 1997, Pages 238-239

  Hanafusa, H ^a   Hanawa, F ^a   Hibino, Y ^a,b   Nozawa, T ^a  

^a NTT CORPORATION   (Japan)

^b Photonic Integration Research Inc

Author keywords

Optical couplers; Planer lightwave circuits; Reliability; Reliability theory

Indexed keywords

ACTIVATION ENERGY; ELECTRIC LOSSES; FAILURE ANALYSIS; FIBER OPTIC NETWORKS; LIGHT EMITTING DIODES; RELIABILITY THEORY; WAVEGUIDE COUPLERS; WEIBULL DISTRIBUTION;

HAZARD RATE; INSERTION LOSSES; PLANAR LIGHTWAVE CIRCUITS; RELIABILITY ESTIMATION;

OPTICAL BEAM SPLITTERS;

EID: 0030735323     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19970138     Document Type: Article

References (6)

1. GADONNA, M., DRAYCOTT, T., and GUNDERSEN, S.: 'Results of accelerated lifetests on passive optical splitters'. Proc. 13th Ann. Conf. on European Fiber Optic Communications and Networks, 1995, pp. 65-69
2. KAWACHI, M.: 'Silica waveguides on silicon and their application to inteerated-optic components', Opt. Quantum Electron., 1990, 22, pp. 391-416
3. KOBAYASHI, S., KITOH, T., HIDA, Y., SUZUKI, S., and YAMAGUCHI, M.: 'Y branching silica waveguide 1 × 8 splitter module', Electron. Lett., 1990, 26, pp. 707-708
4. HANAFUSA, H., TAKATO, N., HANAWA, F., OGUCHI, T., SUDA, H., and OHMORI, Y.: 'Wavelength-insensitive 2 × 16 optical splitters developed using planar lightwave circuit technology', Electron. Lett., 1992, 28, pp. 644-645
5. HIBINO, Y., HANAWA, F., NAKAGOME, H., ISHII, M., and TAKATO, N.: 'High reliability optical splitters composed of silica-based planar lightwave circuits', J. Lightwave Technol., 1995, 13, pp. 1728-1735
6. NELSON, W.: 'Accelerated testing' (Wiley & Sons, Inc., New York, 1960)