Nano-structure and properties of severely deformed TiAl and their evolution on annealing

Materials Science Forum

Volumn 235-238, Issue PART 2, 1997, Pages 589-594

  Korznikov, A V ^a   Korznikova, G F ^a   Valiev, R Z ^a   Dimitrov, O ^b  

^a INSTITUTE FOR METALS SUPERPLASTICITY PROBLEMS   (Russian Federation)

^b CNRS   (France)

Author keywords

Cold work; Electrical resistivity; Intermetallics; Microhardness; Nanocrystalline materials; Structural stability; TiAl

Indexed keywords

ALUMINUM COMPOUNDS; ANNEALING; DEFORMATION; ELECTRIC CONDUCTIVITY OF SOLIDS; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; STABILITY; TITANIUM COMPOUNDS; TORSION TESTING; X RAY DIFFRACTION ANALYSIS;

MICROHARDNESS;

INTERMETALLICS;

EID: 0030734480     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

References (6)

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5. A. Korznikov, O. Dimitrov, A. Quivy, G. Korznikova, J. Devaud, R. Valiev, Journal de Physique IV, Colloque C7, supplément au Journal de Physique III 5, C7-271 - C7-275 (1995)
6. C. Dimitrov, N. Martin, H. Fekkar, O. Dimitrov, Scripta Mater. 34, 1405-9 (1996)