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Volumn 64, Issue 1, 1996, Pages 97-101

Photoacoustic CdTe surface characterization

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; CHARACTERIZATION; MATHEMATICAL MODELS; SURFACE ROUGHNESS; SURFACES;

CADMIUM TELLURIDE; PHOTOACOUSTIC SIGNAL; SURFACE RECOMBINATION VELOCITY;

PHOTOACOUSTIC EFFECT;

EID: 0030734315 PISSN: 09462171 EISSN: None Source Type: Journal
DOI: 10.1007/s003400050151 Document Type: Article

Times cited : (23)

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2
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