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Volumn 122, Issue 1, 1997, Pages 99-112

A characterisation of the morphology of porous silicon films by proton energy loss fluctuation measurements with a narrow resonance in the 15N(p,αγ)12C reaction

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CHARACTERIZATION; HEAT TREATMENT; MORPHOLOGY; POROUS SILICON; PROTONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030733993     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)00723-9     Document Type: Article
Times cited : (24)

References (28)
  • 18
    • 0040977925 scopus 로고
    • Thesis, Université Denis Diderot Paris 7, January
    • A. Grosman, Thesis, Université Denis Diderot Paris 7, January 1995.
    • (1995)
    • Grosman, A.1
  • 19
    • 0039791466 scopus 로고    scopus 로고
    • Thesis, Université Denis Diderot Paris 7, January
    • V. Morazzani, Thesis, Université Denis Diderot Paris 7, January 1996.
    • (1996)
    • Morazzani, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.