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Volumn 122, Issue 1, 1997, Pages 99-112
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A characterisation of the morphology of porous silicon films by proton energy loss fluctuation measurements with a narrow resonance in the 15N(p,αγ)12C reaction
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
CHARACTERIZATION;
HEAT TREATMENT;
MORPHOLOGY;
POROUS SILICON;
PROTONS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
NARROW RESONANCE;
PROTON ENERGY LOSS FLUCTUATIONS;
DIELECTRIC FILMS;
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EID: 0030733993
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(96)00723-9 Document Type: Article |
Times cited : (24)
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References (28)
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