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Volumn 122, Issue 11, 1997, Pages 1283-1288

Analytical bias: The neglected component of measurement uncertainty

Author keywords

Analytical bias; Measurement uncertainty; Reference materials

Indexed keywords

SILICON DIOXIDE;

EID: 0030727924     PISSN: 00032654     EISSN: None     Source Type: Journal    
DOI: 10.1039/a704789d     Document Type: Conference Paper
Times cited : (18)

References (20)
  • 2
    • 0003703662 scopus 로고
    • Laboratory of the Government Chemist, Teddington, UK
    • Eurachem Working Group, Quantifying Uncertainty in Analytical Measurements, Laboratory of the Government Chemist, Teddington, UK, 1995.
    • (1995) Quantifying Uncertainty in Analytical Measurements
  • 8
  • 9
    • 0030783204 scopus 로고    scopus 로고
    • Kane, J. S., Analyst, 1997, 122, 1289.
    • (1997) Analyst , vol.122 , pp. 1289
    • Kane, J.S.1
  • 13
    • 0023509724 scopus 로고
    • ed. Elliott, I. L., and Smee, B. M., Association of Exploration Geochemists, Vancouver, BC, Canada
    • Kane, J. S., and Dorrzapf, A. F., Jr., in GeoExpo/86: Exploration of the North American Cordillera, ed. Elliott, I. L., and Smee, B. M., Association of Exploration Geochemists, Vancouver, BC, Canada, 1987, pp. 184-188.
    • (1987) GeoExpo/86: Exploration of the North American Cordillera , pp. 184-188
    • Kane, J.S.1    Dorrzapf Jr., A.F.2
  • 14
    • 34547393449 scopus 로고    scopus 로고
    • unpublished control sample data
    • Kane, J. S., unpublished control sample data.
    • Kane, J.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.