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Volumn , Issue , 1997, Pages 137-140
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Efficiency of junction termination techniques vs oxide trapped charges
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
COMPUTER SIMULATION;
ELECTRIC BREAKDOWN OF SOLIDS;
ELECTRIC FIELDS;
ELECTRON TRANSPORT PROPERTIES;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR JUNCTIONS;
JUNCTION TERMINATION TECHNIQUES;
OXIDE TRAPPED CHARGES;
POWER ELECTRONICS;
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EID: 0030721272
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (8)
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References (10)
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