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Volumn 441, Issue , 1997, Pages 289-293
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Doping properties of the ion-beam sputtered SiGe film
a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
BORON;
COMPOSITION EFFECTS;
CRYSTAL ORIENTATION;
DIFFUSION IN SOLIDS;
ION BEAMS;
ION IMPLANTATION;
PHOSPHORUS;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTOR DOPING;
SPUTTERING;
HALL MOBILITY;
SEMICONDUCTING FILMS;
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EID: 0030721103
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (5)
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