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Volumn 441, Issue , 1997, Pages 289-293

Doping properties of the ion-beam sputtered SiGe film

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BORON; COMPOSITION EFFECTS; CRYSTAL ORIENTATION; DIFFUSION IN SOLIDS; ION BEAMS; ION IMPLANTATION; PHOSPHORUS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DOPING; SPUTTERING;

EID: 0030721103     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (5)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.