Measurement uncertainty in EMI emission measurements

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 1997, Pages 270-273

  Stecher, Manfred ^a  

^a ROHDE AND SCHWARZ GMBH AND CO KG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVE EMISSION; STANDARDIZATION;

ELECTROMAGNETIC WAVE INTERFERENCE EMISSION MEASUREMENT;

ELECTROMAGNETIC WAVE INTERFERENCE;

EID: 0030720140     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/elmagc.1997.617139     Document Type: Conference Paper

References (14)