Board-level built-in test: The natural next step

National Electronic Packaging and Production Conference-Proceedings of the Technical Program (West and East)

Volumn , Issue , 1997, Pages 75-86

  Ungar, Louis Y ^a  

^a ATE Solutions Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; PRINTED CIRCUIT BOARDS;

AUTOMATIC TEST EQUIPMENT (ATE); BUILT IN TEST (BIT);

INTEGRATED CIRCUIT TESTING;

EID: 0030717376     PISSN: 04700155     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)