XPS study of the PbSe/CaF2(111) interface grown on Si by MBE

Materials Research Society Symposium - Proceedings

Volumn 450, Issue , 1997, Pages 457-462

  Fang, X M ^a   Liu, W K ^a   McCann, P J ^a   Strecker, B N ^a   Santos, M B ^a  

^a UNIVERSITY OF OKLAHOMA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; BINDING ENERGY; BOND STRENGTH (CHEMICAL); CHEMICAL BONDS; FLUORSPAR; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; X RAY PHOTOELECTRON SPECTROSCOPY;

LEAD SELENIDE;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 0030715469     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)