Electron time-of-flight measurements in porous silicon

Materials Research Society Symposium - Proceedings

Volumn 452, Issue , 1997, Pages 613-618

  Rao, Prasanna ^a   Schiff, E A ^a   Tsybeskov, L ^a   Fauchet, P M ^a  

^a SYRACUSE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; ELECTRIC CURRENT MEASUREMENT; ELECTROLUMINESCENCE; ELECTRON TRANSPORT PROPERTIES; LASER APPLICATIONS; TEMPERATURE;

ELECTROLUMINESCENCE MODULATION; ELECTROLUMINESCENT POROUS SILICON DIODE; TRANSIENT PHOTOCURRENT MEASUREMENT;

POROUS SILICON;

EID: 0030714885     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)