Reproducibility of low temperature capacitance thermometers based on (Pb0.45Sn0.55)2P2Se6 single crystal

Ferroelectrics

Volumn 192, Issue 1-4, 1997, Pages 349-352

  Wiegers, S A J ^a   Maior, M M ^b   Penning, F C ^a   Molnar, S H B ^b   Van Kempen, H ^a   Vysochanskii, Yu M ^b   Maan, J C ^a  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^b UZHGOROD NATIONAL UNIVERSITY   (Ukraine)

Author keywords

Capacitance thermometer; Low temperatures; Reproducibility

Indexed keywords

CAPACITANCE; CRYSTAL DEFECTS; LOW TEMPERATURE TESTING; PHOSPHORUS COMPOUNDS; SINGLE CRYSTALS; THERMAL CYCLING; THERMOMETERS;

CAPACITANCE THERMOMETERS;

FERROELECTRIC MATERIALS;

EID: 0030714298     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199708216211     Document Type: Article

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