Influence of nanocrystallinity on properties of photodiode and TFT image sensor structure

Materials Research Society Symposium - Proceedings

Volumn 452, Issue , 1997, Pages 913-918

  Kolodziej, A ^a   Nowak, S ^a   Krewniak, P ^a  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; HYDROGEN; IMAGE SENSORS; MAGNETRON SPUTTERING; PHOTODIODES; RAMAN SCATTERING; THIN FILM TRANSISTORS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

NANOCRYSTALLIZATION; SMALL ANGLE X RAY DIFFRACTION;

AMORPHOUS SILICON;

EID: 0030713703     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)