Linearizing integrated Hall devices

International Conference on Solid-State Sensors and Actuators, Proceedings

Volumn 1, Issue , 1997, Pages 393-396

  Schott, Ch ^a   Popovic, R S ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR CORRECTION; JUNCTION GATE FIELD EFFECT TRANSISTORS; MAGNETIC FIELD MEASUREMENT; SEMICONDUCTOR JUNCTIONS;

MAGNETIC SENSORS; SILICON HALL DEVICES;

HALL EFFECT TRANSDUCERS;

EID: 0030713195     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)