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Volumn 1, Issue , 1997, Pages 715-716
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Model for the etch stop location on reversed biased pn junctions
a a a a a
a
SensoNor Asa
(Norway)
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROCHEMISTRY;
ETCHING;
SEMICONDUCTOR DEVICE MODELS;
SILICON WAFERS;
ELECTROCHEMICAL ETCH STOP (ECES);
SEMICONDUCTOR JUNCTIONS;
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EID: 0030713189
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (7)
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