Structural analysis of GaN and GaN/InGaN/GaN DH structures on sapphire (0001) substrate grown by MOCVD

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 441-446

  Sato, H ^a   Naoi, Y ^a   Sakai, S ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

METALLORGANIC CHEMICAL VAPOR DEPOSITION; NITRIDES; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

GALLIUM NITRIDE; MOSAIC STRUCTURES;

MULTILAYERS;

EID: 0030711985     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)