ESD protection design and applications to bidirectional antenna protection for sub-5 nm gate oxides

International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings

Volumn , Issue , 1997, Pages 33-37

  Amerasekera, Ajith ^a   Krishnan, Srikanth ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC DISCHARGES; ELECTRIC EQUIPMENT PROTECTION; GATES (TRANSISTOR); OXIDES;

ELECTROSTATIC DISCHARGE (ESD) PROTECTION DESIGN;

CMOS INTEGRATED CIRCUITS;

EID: 0030711972     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)